XPS depth profiling analysis of polymer brushes using an argon gas cluster ion source

Alkorbi, Jabrah (2023) XPS depth profiling analysis of polymer brushes using an argon gas cluster ion source. PhD thesis, University of Sheffield.

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Supervisors: Graham, Leggett
Awarding institution: University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Chemistry (Sheffield)
The University of Sheffield > Faculty of Science (Sheffield)
Depositing User: Mrs Jabrah Alkorbi
Date Deposited: 10 Oct 2023 09:40
Last Modified: 10 Oct 2024 00:06
Open Archives Initiative ID (OAI ID):

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