Susceptibility Predictions of ICs to EMI and Validation of Stochastic EM fields Coupling with a Bespoke RF IC Detector

This research addresses electromagnetic interference (EMI) challenges at high frequencies by developing an advanced methodology to estimate the probability of susceptibility of Integrated Circuits (ICs). The objective is to develop an advanced methodology for estimating the probability of susceptibility of ICs or components on a printed circuit board (PCB) to EMI by statistically characterizing the power absorbed by electronic circuits and enhancing power balance (PWB) methods for enclosures and internal components. The IC EMC standard IEC 62132-4, enables the assessment of susceptibility of an IC by determining the forward power required to induce a malfunction at each pin. This work enhances the previously developed numerical model by incorporating PCB losses, which enables us to estimate the distribution of coupled forward power at the package pin over a number of stirrer positions in a reverberant field. Based on these insights, the research establishes a methodology for predicting the probability of susceptibility of ICs, provided that the component's susceptibility level, transmission line parameters, and the loading of the attached track are known.
This work also validates the numerical model through the design and testing of an instrumented custom-designed radio frequency integrated circuit (RF IC) detector, capable of measuring coupled power at its package pin via test PCB tracks. Building upon previous knowledge of PWB methods, using the purpose-built RF IC detector we introduced an enhanced PWB method capable of incorporating the influence of average absorption cross-section (AACS) of the IC at package pins and connected PCB tracks, along with other relevant AACS for internal components within the enclosure. The in-depth consideration of AACS of the components such as PCB tracks and ICs on the device under test, is an upgrade to previously developed PWB methods.