Measuring Low Dimensional Schottky Barriers of Rare Earth Silicide-Silicon Interfaces

Vick, Andrew J (2011) Measuring Low Dimensional Schottky Barriers of Rare Earth Silicide-Silicon Interfaces. PhD thesis, University of York.

Abstract

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Supervisors: Tear, Steve and Thompson, Sarah
Keywords: Schottky Barriers, Rare Earth Silicides, Silicon, Thin Film Growth, Manganese, Scanning Probe Spectroscopy (SPS), Scanning Tunnelling Microscopy (STM), Spintronics
Awarding institution: University of York
Academic Units: The University of York > Physics (York)
Identification Number/EthosID: uk.bl.ethos.556337
Depositing User: Mr Andrew J Vick
Date Deposited: 11 Jun 2012 15:03
Last Modified: 08 Sep 2016 12:21

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