Roll-to-roll In-Process Measurements For Flexible Electronics

Metadata

Supervisors:	Tiwari, Ashutosh
Related URLs:	A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (Related publication) Dataset: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (Research data) Enhancing Thin-Film Wafer Inspection With A Multi-Sensor Array And Robot Constraint Maintenance (Related publication)
Keywords:	sensor; array; reflectometry; thin-film; thickness; R2R; roll-to-roll; Python; Arduino
Awarding institution:	University of Sheffield
Academic Units:	The University of Sheffield > Faculty of Engineering (Sheffield) > Electronic and Electrical Engineering (Sheffield)
Date Deposited:	03 Apr 2025 14:39
Last Modified:	28 Mar 2026 01:05
Open Archives Initiative ID (OAI ID):	oai:etheses.whiterose.ac.uk:36580

Download

Final eThesis - redacted (pdf)

Filename: Thesis__FINAL_ REDACTED.pdf

Description: Redacted Thesis - 1 year embargo

Licence:
This work is licensed under a Creative Commons Attribution NonCommercial NoDerivatives 4.0 International License

CLICK TO DOWNLOAD

[thumbnail of Redacted Thesis - 1 year embargo]

You do not need to contact us to get a copy of this thesis. Please use the 'Download' link(s) above to get a copy.
You can contact us about this thesis. If you need to make a general enquiry, please see the Contact us page.

Roll-to-roll In-Process Measurements For Flexible Electronics

Metadata

Download

Final eThesis - redacted (pdf)

Export

Statistics

Roll-to-roll In-Process Measurements For Flexible Electronics

Metadata

Download

Final eThesis - redacted (pdf)

Related datasets

Export

Statistics