Roll-to-roll In-Process Measurements For Flexible Electronics

Metadata

Supervisors:	Tiwari, Ashutosh
Related URLs:	A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (Related publication) Dataset: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing (Research data) Enhancing Thin-Film Wafer Inspection With A Multi-Sensor Array And Robot Constraint Maintenance (Related publication)
Keywords:	sensor; array; reflectometry; thin-film; thickness; R2R; roll-to-roll; Python; Arduino
Awarding institution:	University of Sheffield
Academic Units:	The University of Sheffield > Faculty of Engineering (Sheffield) > Electronic and Electrical Engineering (Sheffield)
Depositing User:	Néstor Eduardo Sánchez Arriaga
Date Deposited:	03 Apr 2025 14:39
Last Modified:	03 Apr 2025 14:39
Open Archives Initiative ID (OAI ID):	oai:etheses.whiterose.ac.uk:36580

Embargoed until: 28 March 2026

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