Quantification of SE dopant contrast in low voltage scanning electron microscope

Zaggout, Fatima Nouh (2007) Quantification of SE dopant contrast in low voltage scanning electron microscope. PhD thesis, University of York.

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Awarding institution: University of York
Academic Units: The University of York > School of Physics, Engineering and Technology (York)
Academic unit: Department of Electronics
Identification Number/EthosID: uk.bl.ethos.441036
Depositing User: EThOS Import (York)
Date Deposited: 18 Dec 2015 17:22
Last Modified: 21 Mar 2024 14:47
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