Application of Focused Ion Beam for Micro-machining and Controlled Quantum Dot Formation on Patterned GaAs Substrate

Zhang, Haoyu (2013) Application of Focused Ion Beam for Micro-machining and Controlled Quantum Dot Formation on Patterned GaAs Substrate. PhD thesis, University of Sheffield.

Abstract

Metadata

Supervisors: Thomas, Walther
Awarding institution: University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Electronic and Electrical Engineering (Sheffield)
Identification Number/EthosID: uk.bl.ethos.605390
Depositing User: Mr Haoyu Zhang
Date Deposited: 27 Jun 2014 11:52
Last Modified: 03 Oct 2016 11:16

Download

PDF with images and text

Filename: Thesis Haoyu Zhang final submission.pdf

Description: PDF with images and text

Licence: Creative Commons Licence
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 2.5 License

Export

Statistics


You do not need to contact us to get a copy of this thesis. Please use the 'Download' link(s) above to get a copy.
You can contact us about this thesis. If you need to make a general enquiry, please see the Contact us page.